Phenom Pro/ProX Desktop SEM
The Phenom Pro/ProX G6 desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. A unique and powerful core architecture combines with a host of hardware and software features to provide the most complete desktop SEM solution on the market.
Features
The Phenom Pro/ProX G6 desktop SEM a high-performance SEM for imaging and analysis. Upgrade the Pro to a ProX for analyzing sample structures AND their elemental composition. Elemental Mapping and Line Scan allows further analysis of the distribution of elements. The innovative design of the Phenoms desktop SEM provides several advantages over every other desktop SEM:
- Only 30 seconds from sample loading to electron imaging. The Phenom desktop SEM is the fastest SEM.
- The high brightness Cerium Hexaboride (CeB6) source is 10x brighter than tungsten sources resulting in better image resolution at lower accelerating voltages on any sample.
- 多个加速电压
- Color optical camera for single-click navigation
- Charge reduction mode reduces need to coat samples
- 元素分析EDS / EDX选项
- Secondary electron detector option
- Small footprint
- 不需要基础设施
Phenom Software
Software options are available to meet your SEM needs, including automated and market-specific solutions. Energy dispersive X-ray spectroscopy (EDS) can be added to analyze the elemental composition of samples.
全新Phenom User Interface!
Specifications
| Phenom Pro/ProX G6 Desktop SEM | |
|---|---|
| Optical navigation camera | •彩色镜像 • Bright-field and dark-field illumination • Magnification range: 20 – 134x |
| Electron source | Ultra-high brightness, long-life CeB6crystal source |
| Max. SEM magnification | 350,000x |
| 解决 | • ≤ 8 nm (BSD) •≤6nm（sed）（可选） |
| Image output resolution | Up to 7,680 x 4,800 pixels |
| Acceleration voltages | • Presets: 5 kV, 10 kV, and 15 kV • Adjustable range: 4.8 kV – 20.5 KV |
| 真空模式 | High and low vacuum |
| Detectors | •BSD. •EDS（可选） • SED (optional) |
| Sample diameter | Up to 32 mm |
| Sample height | 高达100毫米 |
| 与其他Phomom SEM比较 | |